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XRD and Electron-Microscopy Investigations of Layer Silicates

XRD and Electron-Microscopy Investigations of Layer Silicates - The Canadian Mineralogist Vol. 36, part 6

XRD and Electron-Microscopy Investigations of Layer Silicates – The Canadian Mineralogist Vol. 36, part 6

Editors: R.F. Martin

A demonstration of the power of a combined XRD-TEM approach in the study of layer silicates.

Softcover. 242 pages. 1998.

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MAC Member Price: $16 CAD/USD

Publication Price $20.00 CAD/USD
ID: TI36-6
ISBN: 0008-4476

Description

XRD and Electron-Microscopy Investigations of Layer Silicates – The Canadian Mineralogist Vol. 36, part 6

Contents:

D. R. Peacor
P. H. Nadeau
F. NietoJ. Cuadros
G. D. GuthrieR. C. Reynolds
Gejing LiD. R. PeacorP. R. BuseckP. Arkai
L. N. WarrF. Nieto
F. ElsassA. BeaumontM. PernesA. M. JaunetD. Tessier
S. K. SearsR. HesseH. Vali
S. K. SearsR. HesseH. ValiW. C. ElliottJ. L. AronsonR. F. Martin
S. ShataR. Hesse
A. WiewioraA. WilamowskiB. LackaM. KuzniarskiD. Grabska
R. Kitagawa
T. MatsudaM. Kurosaki
Jian-Jie LiangF. C. Hawthorne
S. GuggenheimWudi Zhan
S. Uehara
F. J. WicksG. S. HendersonF. C. HawthorneJ. Kjoller
I. BobosC. Gomex
R. W. BerryJ. K. Torrance
J. Douglas Scott
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